Structural comparison studies of PbPc and CuPc thin films

The thin film of Lead Phthalocyanine (PbPc) and Cupper Phthalocyanine (CuPc) on glass are prepared by Vacuum deposition method. Deposition of PbPc and CuPc on pre-cleaned glass substrates under the pressure of 10-6 Torr are achieved by slowly varying the current. The rate of evaporation is properly controlled and maintained constant during all the evaporations. The thicknesses of the films are 150 nm, 300 nm and 450 nm on glass substrate. The thickness of sample 450 nm annealed at 323 K and 373 K temperature. Diffraction is one of the most powerful methods of the study and structure of materials, which may involve X-rays, electrons. The relative ease and convenience, large diffraction angle, representation of the average crystalline lattice throughout the film and simultaneous display of diffraction pattern from the film make the XRD method a successful analytical technique for the study of thin films. The sample has been analysed by X-ray diffraction (XRD) to get structural analysis of the PbPc and CuPc thin films

Author(s): S. Sivamalar1, J. Shanthi2 and Pon Kalugasalam1

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