Reach Us +44-1904-929220


Characterization of Thin Films of Cd - doped SnO for Optoelectronic Applications

Cadmium tin oxide Cd2SnO4 thin films were prepared by RF magnetron sputtering technique on glass substrates at room temperature. The as-prepared films were amorphous. The optical parameters as transmittance, optical energy gap, refractive index and the width of the band tails of the localized states found to be affected by changing the annealing temperature and thicknesses of the films. The electrical resistivity found to be affected by annealing temperature too.

Author(s): Mostafa M. Abd El-Raheem , Mahmoud. S. Rasheedy , Hamed. E. Ahmed a,, Mohamed. S. Abd El-Aal , Huda. H. Al-Ofi , Essam E.Mohamed

Abstract | PDF

Share this  Facebook  Twitter  LinkedIn  Google+
30+ Million Readerbase

Recommended Conferences

Abstracted/Indexed in
  • Chemical Abstracts Service (CAS)
  • Index Copernicus
  • Google Scholar
  • Genamics JournalSeek
  • China National Knowledge Infrastructure (CNKI)
  • CiteFactor
  • Electronic Journals Library
  • Directory of Research Journal Indexing (DRJI)
  • WorldCat
  • Proquest Summons
  • Publons
  • Serials Union Catalogue (SUNCAT)
  • Geneva Foundation for Medical Education and Research
  • Secret Search Engine Labs